CHARACTERIZATION OF THIN-FILM BISMUTH VANADIUM OXIDE (BIVOX) SEMICONDUCTORS FOR PHOTOELECTROLYSIS APPLICATIONS

Hydrogen is one of the most promising renewable and sustainable clean energy carriers. For hydrogen energy to be truly “green” it must be produced by non-polluting methods. One such method is photoelectrolysis, in which photosensitive semiconductor electrodes immersed in an electrolyte directly convert solar energy into hydrogen fuel. This work focuses on the development of characterization methods and a new testing apparatus for experimental semiconductor photoelectrodes. Characterization methods include measuring the photocurrent density as a function of the bias voltage, X-Ray diffraction, SEM imaging, and UV/VIS spectroscopy. Along with developing methods for characterizing the semiconductor materials, the testing procedures were refined to ensure repeatability. Samples of Bismuth Vanadium Oxide (BiVOx), Titanium Dioxide (TiO2) , and Tungsten Trioxide (WO3) were characterized using these techniques. BiVOx was investigated for comparison with theoretical performed by a group at NREL (National Renewable Energy Laboratory) on dopants and their effect on electrical properties. Results from testing the samples will be presented along with the proposed timeline for the completion of the updated sample testing device.

Additional Abstract Information

Student(s): Brandon H. Journell

Department: Engineering

Faculty Advisor: Dr. Keith Holland, Dr. David Lawrence

Type: Oral

Year: 2012